Key specifications
- 15 TS/s (64 fs) sequential sampling
- Up to 15 GHz prescaled, 2.5 GHz direct trigger and 11.3 Gb/s clock recovery
- Industry-leading 16-bit 1 MS/s ADC and 60 dB dynamic range
- Eye and mask testing to 16 Gb/s with up to 223–1 pattern lock
- Intuitive, touch-compatible Windows user interface
- Comprehensive built-in measurements, histogramming and editable data mask library
- Integrated, differential, deskewable TDR/TDT step generator
Typical applications
- Telecom and radar test, service and manufacturing
- Optical fiber, transceiver and laser testing
- RF, microwave and gigabit digital system measurements
- Radar bands I, G, P, L, S, C, X, Ku
- Precision timing and phase analysis
- Digital system design and characterization
- Eye diagram, mask and limits test to 10 Gb/s
- Ethernet, HDMI 1, HDMI 2, PCI, SATA, USB 2.0, USB 3.0
- TDR/TDT analysis of cables, connectors, backplanes, PCBs and networks
- Optical fiber, transceiver and laser test
- Semiconductor characterization
